Test Tray Chamber Pile up the probe board and press Layer1 Layer2 Layer3 Layer4 Layer5 Layer6 Layer7 Layer8 Layer9 Layer10 Contorol BOX Renice NFA100 NandFlash Test Platform Accurate and Fast Nand flash Screening Power BOX Press Unit Shenzhen Renice Technology Co., Ltd
NFA100 Specification Supports 3D NAND with newest process, 1x nm and 25nm, 34nm, 56nm Nand. Supports SLC,MLC,TLC,eMLC. Supports 8-bit and 16-bit Asynchronous Nand. Test customer s self-developed BCH ECC or LDPC intensity. Test Read Retry. Test NAND Flash at varying voltage. Test of physical destroy over NAND Flash. Supports Aynchronous, Toggle Flash. Supports regular NAND from Micron, Toshiba, Samsung, Intel, Sandisk and Hynix. Supports Nand with TSOP48, BGA63, BGA100, BGA132, BGA152 packagage. Custom and develop unconventional and self-defined packaged Nand
02 HW Structure Introduction The hardware structure have two options: semi-automatic and fully automatic. For applications, such as military special function chip analysis and screening, semiautomatic operation equipment might be enough. For high-efficiency and high-volume screening applications, it might need fully automated operation structure.
NFA100 HW Structure Main board and BGA/TOSP board All Nand flash are put into the High-Low temperature chamber. The test host is outside the High-Low temperature chamber. Equipped with mechanical arm for automated loading or unloading of NAND Flash.
Test Result Display Colors "Red, Blue, Green and Yellow" shows different result. For fully automatic equipment, the equipment will be automatically classified according to different colors.
Test Script automatically generated The clients needs to fill in the corresponding parameters of the Nand Flash when subscribing to the tests. The system automatically generates test scripts. If special tests requirement, clients can custom the test script.
Software of test Script
03 Functions/Tests
Supports Threshold Voltage Distribution tests
Supports 4 types of ECC capacity tests
Supports various pattern & custom Embedded with multiple mainstream test patterns. Custom patterns according to tests requirement. Support pattern's bit Flip test.
Supports tests to any page
Supports All flash manufacturer's Nand Flash
Supports Factory Bad Block Management
Supports sending any command to any address
Page&Block real performance assessment
Page&Block real performance assessment
Supports error distribution analysis
bit error's statistic analysis
Supports Program Disturb Test
Supports ReadRetry Test
Supports RBER&UBER Analyze Accurately evaluate RBER. Accurately evaluate UBER under 4 types of ECC test conditions. Accurately evaluate UBER and RBER under different P/E cycle. Output and analyze the evaluation result.
Supports operation to P/E cycle in the setting pattern
Supports Script andapi NFA100 provides Script, allowing clients more flexibly to custom test modes. Supports API, allow clients customing tests interface.
THANKS Website:wwwrenice-tech.com Contact us: sales@renice-tech.com